CHEN YuLong, LI ShuJuan, BU WenHao, et al. OPTIMIZE PROCESS OF WEDM MONOCRYSTALLINE SILICON BASE ON RESPONSE SUEFACE METHOD AND IMPROVED NON-DOMINATED GENETIC ALGORITHM. [J]. 41(1):98-103(2019)
DOI:
CHEN YuLong, LI ShuJuan, BU WenHao, et al. OPTIMIZE PROCESS OF WEDM MONOCRYSTALLINE SILICON BASE ON RESPONSE SUEFACE METHOD AND IMPROVED NON-DOMINATED GENETIC ALGORITHM. [J]. 41(1):98-103(2019) DOI: 10.16579/j.issn.1001.9669.2019.01.017.
OPTIMIZE PROCESS OF WEDM MONOCRYSTALLINE SILICON BASE ON RESPONSE SUEFACE METHOD AND IMPROVED NON-DOMINATED GENETIC ALGORITHM
Pursuiting cutting efficiency and surface quality during machining monocrystalline silicon can improve the quality of the wafer itself and reduce the production cost. The second-order model of variable parameter voltage,pulse on time,pulse interval,wire saw speed and process result is established by response surface method,The variance analysis shows that the model equation is significant. The improved non-dominated genetic algorithm( NSGA-II) is used to optimize processing process,and we can get a set of non-dominated solutions. These non-dominated solutions can satisfy the needs of engineering workers under different conditions. The corresponding experimental proving the non-dominated solution is feasible.
THE OPTIMIZATION OF THE PROCESS PARAMETERS IN THE COURSE OF THE ELECTRICAL DISCHARGE MACHINING OF THE MONOCRYSTALLINE SILICON WHICH IS BASED ON THE PARETO FRONTIER
MODELING ANALYSIS AND EXPERIMENTAL RESEARCH OF THE MATERIAL REMOVAL RATE OF THE MONOCRYSTALLINE SILICON IN THE COURSE OF THE ELETRICAL DISCHARGE MACHINING
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Institute of Technology,Xi’an University of Technology
Xi’an Modern Control Technology Research Institute